The Ultramicroscopy group is based around exploring the design and function of the aberration-corrected scanning transmission electron microscope (STEM). Based in the Advanced Microscopy Laboratory, we work to improve the acquisition and analysis of atomic-resolution annular dark-field (ADF) imaging data and EELS & EDX chemical mapping.
Our research activity spans both hardware and software development for the STEM, with areas including ADF normalisation by detector efficiency, correction of scan-noise and scan-distortion, and correction of artefacts in EELS spectra. We research and develop techniques for picometer-scale precision imaging, low-dose STEM, novel scanning strategies, and hysteresis-mitigation.
